大直径连续拉晶状态下径向电阻率影响机理

何显; 李进; 王忠良; 白楠; 瞿立; 周春玲

doi:doi:10.19912/j.0254-0096.tynxb.2024-1364

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大直径连续拉晶状态下径向电阻率影响机理

更新时间：2026-01-08

- 大直径连续拉晶状态下径向电阻率影响机理
- 大直径连续拉晶状态下径向电阻率影响机理
- 太阳能学报 2025年46卷第12期页码：271-276
- 作者机构：
- 作者简介：
- 基金信息：
  
  国家自然科学基金（51962030）;宁夏自治区重大项目（2024ZDYF1254）;银川市科技创新项目（2022XQZD006）
- DOI：doi:10.19912/j.0254-0096.tynxb.2024-1364
  中图分类号： O782
- 网络出版：2026-01-07，
  
  纸质出版：2025
- 稿件说明：
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何显, 李进, 王忠良, 等. 大直径连续拉晶状态下径向电阻率影响机理[J]. 太阳能学报, 2025,46(12):271-276.

何显, 李进, 王忠良, et al. 大直径连续拉晶状态下径向电阻率影响机理[J]. 2025, 46(12): 271-276.
何显, 李进, 王忠良, 等. 大直径连续拉晶状态下径向电阻率影响机理[J]. 太阳能学报, 2025,46(12):271-276. DOI： doi:10.19912/j.0254-0096.tynxb.2024-1364.

何显, 李进, 王忠良, et al. 大直径连续拉晶状态下径向电阻率影响机理[J]. 2025, 46(12): 271-276. DOI： doi:10.19912/j.0254-0096.tynxb.2024-1364.

摘要

利用STR公司开发设计的专业晶体生长模拟软件CGSim

结合晶体动力学和热力学

选用N型单晶硅常用掺杂剂磷

按多晶硅质量的10-7倍添加磷单质作掺杂剂

选取8种不同坩埚转速7~14 r/min

6种不同晶体转速6~11 r/min

在更高拉晶速率1.8 mm/min下做正交模拟实验得到电阻率变化。通过分析内坩埚熔体温场及流场、外坩埚熔体温场及流场、固液界面、晶体中缺陷等参数

得出合适的坩埚转速、晶体转速

与固液界面处的磷浓度转换为电阻率得到的径向电阻率变化做对比

探讨连续直拉单晶硅径向电阻率的影响机理。

Abstract

Utilizing CGSim

a professional crystal growth simulation software developed and designed by STR

combining crystal dynamics and thermodynamics

selecting N-type monocrystalline silicon commonly used dopant phosphorus is selected

according to the polycrystalline silicon mass of 10 times to add phosphorus monomers as dopant

meanwhile selecting eight different crucible rotate speeds of 7-14 r/min and six different crystal rotate speeds of 6-11 r/min are selected

and orthogonal simulation experiments with a higher crystal pulling rate of 1.8 mm/min were conducted to obtain the change of electrical resistivity. By analyzing the parameters of inner crucible melt temperature field and flow field

outer crucible melt temperature field and flow field

solid-liquid interface

defects in the crystal

appropriate crucible rotational speed and crystal rotational speed were obtained. By comparing with the radial resistivity change obtained by converting the phosphorus concentration to the resistivity at the solid-liquid interface

the influencing mechanism of the radial resistivity of the continuous direct-drawing monocrystalline silicon was researched.

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references

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GB/T 13389—2014, 掺硼掺磷掺砷硅单晶电阻率与掺杂剂浓度换算规程[S].

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