Li Wan-peng, Liu Qiu-xiang. Ferroelectric, Magnetic Properties and Leakage Currents of SrBi2Ta2O9/LaNiO3 Heterostructure Thin Films[J]. 2014, 31(2): 117-120. DOI: 10.3969/j.issn.1007-7162.2014.02.023.
Li Wan-peng, Liu Qiu-xiang. Ferroelectric, Magnetic Properties and Leakage Currents of SrBi2Ta2O9/LaNiO3 Heterostructure Thin Films[J]. 2014, 31(2): 117-120. DOI: 10.3969/j.issn.1007-7162.2014.02.023.DOI:
SrBi2Ta2O9(SBT)/LaNiO3 (LNO) heterostructure thin films were grown on Si(100) substrate by using a sol-gel process. XRD results reveal high (115) orientation of SrBi2Ta2O9 thin film. The hysteresis loops and leakage current density of the films annealed at different temperatures were measured. The film annealed at 700 ℃ showes the lowest leakage current density and a well saturated P-E hysteresis loop with the largest remnant polarization (Pr) of 716 uC/cm
2
. Leakage mechanism analysis suggests an Ohmic conduction. In addition
the SBT/LNO heterostructures annealed at 700 ℃ exhibit a weak room-temperature ferromagnetic behavior.