Conventional infrared reflective layers often struggle with thermal instability at high temperatures or insufficient infrared reflectivity
limiting their practical applications. In this study
we employed a microalloying approach to enhance film performance by incorporating tantalum (Ta) into silver (Ag) films via magnetron sputtering. The reflective spectra
crystal structure
and surface morphology of the films were systematically analyzed. The results indicate that Ta doping effectively inhibites the preferred growth of the Ag(111) crystal plane. Furthermore
high-vacuum thermal stability tests at 600 ℃ confirm that the AgTa infrared reflective coatings retain excellent optical and structural stability
even under elevated temperatures.
关键词
Keywords
references
KENNEDY C E.Review of mid-to high-temperature solar selective absorber materials[R]. National renewable energy lab(NREL), Golden, CO(United States), 2002.
KIM H C, ALFORD T L.Improvement of the thermal stability of silver metallization[J]. Journal of applied physics, 2003, 94(8): 5393-5395.
HUANG Y, WEN J, ZHAO Y, et al.The effect of Ag addition on the microstructure evolution in peak aging and retrogression and re-aging processes of an Al-Zn-Mg-Cu-Zr alloy[J]. Journal of alloys and compounds, 2025, 1010: 178004.
XU A, LI X, LIU H, et al.Over 10% efficiency pure sulfide kesterite solar cells on transparent electrode with Cd-Ag Co‐alloying[J]. Small, 2025, 21(1): 2407075.
JIAO Z B, SCHUH C A.Nanocrystalline Ag-W alloys lose stability upon solute desegregation from grain boundaries[J]. Acta materialia, 2018, 161: 194-206.
KIM T K, VANSADERS B, CALDWELL E, et al.Copper-alloyed spinel black oxides and tandem-structured solar absorbing layers for high-temperature concentrating solar power systems[J]. Solar energy, 2016, 132: 257-266.
GAO J, TU C, LIANG L, et al.Silver nanoparticles with an armor layer embedded in the alumina matrix to form nanocermet thin films with sound thermal stability[J]. ACS applied materials & interfaces, 2014, 6(14): 11550-11557.
OTTEN M T.High‐angle annular dark‐field imaging on a TEM/STEM system[J]. Journal of electron microscopy technique, 1991, 17(2): 221-230.