您当前的位置:
首页 >
文章列表页 >
Estimating Critical Clearing Time of Grid Faults Using DA of State-Reduction Model of Power Systems
Special Section Papers | 更新时间:2026-10-15
    • Estimating Critical Clearing Time of Grid Faults Using DA of State-Reduction Model of Power Systems

    • Estimating Critical Clearing Time of Grid Faults Using DA of State-Reduction Model of Power Systems

    • 中国电机工程学会电力与能源系统学报(英文)   2024年10卷第2期 页码:807-820
    • DOI:10.17775/CSEEJPES.2022.07170    

      中图分类号:
    • 纸质出版:2024-03-01

    移动端阅览

  • Yang Liu, Zhongyang Chen, Huanjin Yao, 等. Estimating Critical Clearing Time of Grid Faults Using DA of State-Reduction Model of Power Systems[J]. 中国电机工程学会电力与能源系统学报(英文), 2024,10(2):807-820. DOI: 10.17775/CSEEJPES.2022.07170.

    Yang Liu, Zhongyang Chen, Huanjin Yao, et al. Estimating Critical Clearing Time of Grid Faults Using DA of State-Reduction Model of Power Systems[J]. CSEE Journal of Power and Energy Systems, 2024, 10(2): 807-820. DOI: 10.17775/CSEEJPES.2022.07170.

  •  
  •  
icon
试读结束,您可以激活您的VIP账号继续阅读。
去激活 >
icon
试读结束,您可以通过登录账户,到个人中心,购买VIP会员阅读全文。
已是VIP会员?
去登录 >

0

浏览量

0

下载量

0

CSCD

文章被引用时,请邮件提醒。
提交
工具集
下载
参考文献导出
分享
收藏
添加至我的专辑

相关文章

Improved EAD Algorithm to Estimate Domains of Attraction of Power Systems Including Induction Motors for Transient Voltage Stability Analysis
Expanding Annular Domain Algorithm to Estimate Domains of Attraction for Power System Stability Analysis
Estimating Region of Attraction of Power Systems Integrated with Voltage Source Converters: A Review
Machine learning-based fast frequency response control for a VSC-HVDC system
Quantifying Power Flexibility of Multisource Looped District Heating System Using Region-Based Method

相关作者

Lei Chen
Tianhao Wen
Yuqing Lin
Chao Hong
Yinsheng Su
Jiemin Liao
Zhigang Li
Kaishun Xiahou

相关机构

Power Dispatching, and Control Center, China Southern Power Grid
School of Science and Engineering, The Chinese University of Hong Kong (), Shenzhen
University of Tennessee
University of Tennessee, Knoxville, TN 37996, USA and also with the Oak Ridge National Laboratory, Oak Ridge
School of Electrical and Information Engineering, Tianjin University
0