Chenxi Fan, Kaishun Xiahou, Lei Wang, 等. Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks[J]. 中国电机工程学会电力与能源系统学报(英文), 2024,10(4):1563-1574.
Chenxi Fan, Kaishun Xiahou, Lei Wang, et al. Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks[J]. CSEE Journal of Power and Energy Systems, 2024, 10(4): 1563-1574.
Chenxi Fan, Kaishun Xiahou, Lei Wang, 等. Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks[J]. 中国电机工程学会电力与能源系统学报(英文), 2024,10(4):1563-1574.DOI: 10.17775/CSEEJPES.2022.05990.
Chenxi Fan, Kaishun Xiahou, Lei Wang, et al. Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks[J]. CSEE Journal of Power and Energy Systems, 2024, 10(4): 1563-1574.DOI: 10.17775/CSEEJPES.2022.05990.
Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks
This paper presents a long short-term memory (LSTM)-based fault detection method to detect the multiple open-circuit switch faults of modular multilevel converter (MMC) systems with full-bridge sub-modules (FB-SMs). Eighteen sensor signals of grid voltages
grid currents and capacitance voltages of MMC for single and multi-switch faults are collected as sampling data. The output signal characteristics of four types of single switch faults of FB-SM
as well as double switch faults in the same and different phases of MMC
are analyzed under the conditions of load variations and control command changes. A multi-layer LSTM network is devised to deeply extract the fault characteristics of MMC under different faults and operation conditions
and a Softmax layer detects the fault types. Simulation results have confirmed that the proposed LSTM-based method has better detection performance compared with three other methods: K-nearest neighbor (KNN)
naive bayes (NB) and recurrent neural network (RNN). In addition
it is highly robust to model uncertainties and Gaussian noise. The validity of the proposed method is further demonstrated by experiment studies conducted on a hardware-in-the-loop (HIL) testing platform.