1. 中车青岛四方机车车辆股份有限公司
2. 西南交通大学电气工程学院
纸质出版:2024
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潘贵翔, 辛东立, 刘骁, 等. 温度对车载高压电缆终端局部放电特性的影响研究[J]. 四川电力技术, 2024,(2):51-57+93.
潘贵翔, 辛东立, 刘骁, et al. 温度对车载高压电缆终端局部放电特性的影响研究[J]. 2024, (2): 51-57+93.
潘贵翔, 辛东立, 刘骁, 等. 温度对车载高压电缆终端局部放电特性的影响研究[J]. 四川电力技术, 2024,(2):51-57+93. DOI: 10.16527/j.issn.1003-6954.20240209.
潘贵翔, 辛东立, 刘骁, et al. 温度对车载高压电缆终端局部放电特性的影响研究[J]. 2024, (2): 51-57+93. DOI: 10.16527/j.issn.1003-6954.20240209.
电缆终端作为高速列车的一个重要设备,在接触网与列车之间的能量传递中起着重要作用。然而由电缆终端界面缺陷引起的局部放电,严重影响着电缆终端的绝缘性能与列车的行车安全。通过实验的方法,制作了含有不同长度气隙的电缆终端试验品,并在27.5 kV的电压条件下进行了实验,探究了不同缺陷长度的电缆终端在不同环境温度下的局部放电特性。结果表明,相同气隙长度的电缆终端在27.5 kV的电压条件下,其局部放电量随着环境温度呈现出先上升后下降的趋势。根据这一特性可以知道在一定的电压等级之下,电缆终端的放电量主要受温度影响,当超过某一温度后,由于温升导致的电缆终端内部压力变化成为影响局部放电量的主要因素,并且随着气隙长度的增加,同一温度下的局部放电起始电压呈现增加的趋势。
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Kantar Emre,Mauseth Frank,Ildstad Erling,Hvidsten Sverre.Longitudinal AC breakdown voltage of XLPE-XLPE interfaces considering surface roughness and pressure[J].IEEE Transactions on Dielectrics and Electrical Insulation,2017.
Kantar, Emre,Panagiotopoulos, Dimitrios,Ildstad, Erling.Factors Influencing the Tangential AC Breakdown Strength of Solid-Solid Interfaces[J].IEEE transactions on dielectrics and electrical insulation: A publication of the IEEE Dielectrics and Electrical Insulation Society,2016.
Hasheminezhad, M.,Ildstad, E..Application of contact analysis on evaluation of breakdown strength and PD inception field strength of solid-solid interfaces[J].IEEE transactions on dielectrics and electrical insulation: A publication of the IEEE Dielectrics and Electrical Insulation Society,2012.
Partial discharge-induced degradation characteristics of insulating structure constituting oil-immersed power transformers[J].IEEE transactions on dielectrics and electrical insulation: A publication of the IEEE Dielectrics and Electrical Insulation Society,2010.
Okabe, S.,Ueta, G.,Wada, H.,Okubo, H..Partial discharge-induced degradation characteristics of oil-impregnated insulating material used in oil-immersed power transformers[J].IEEE transactions on dielectrics and electrical insulation: A publication of the IEEE Dielectrics and Electrical Insulation Society,2010.
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