LI Dengdiao, YUAN Kaipu, ZHOU Qindi. Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage[J]. Rural Electrification, 2026, (6): 84-88.
LI Dengdiao, YUAN Kaipu, ZHOU Qindi. Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage[J]. Rural Electrification, 2026, (6): 84-88.DOI: 10.13882/j.cnki.ncdqh.2601A046.
To address the low efficiency of low-voltage leakage location
this paper develops a fault location device for upstream tripping caused by low-voltage leakage
which is specifically designed to prevent frequent power outages caused by leakage in meter boxes. By integrating low-voltage AC magnetic power tapping connectors
multiple voltage and current monitoring units
intelligent algorithms
and a micro application system
the device realizes accurate monitoring and rapid location of leakage faults. It features convenient installation
safe operation
continuous data acquisition
and fast response
thereby accelerating fault reporting and repair response and improving customer satisfaction. The device has significant technical advantages and practical value.