Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors

Liangtian Zhang; Yuyan Chen; Zhaochen Wang; Zening Lu; Zhaoliang Xing; Shaowei Guo; Haosen Du; B. X. Du; Meng Xiao

doi:10.1049/ema3.70031

欢迎来到能源电力期刊网！

English Version 期刊登录

您当前的位置：

首页 >

文章列表页 >

Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors

更新时间：2026-09-24

- Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors
- Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors
- Electrical Materials and Applications 2026年3卷第1期
- 作者机构：
  
  1. School of Electrical and Information Engineering, Tianjin University,Tianjin,China
  2. Contribution: Data curation, Writing - original draft, Writing - review & editing, Validation, Visualization, Formal analysis
  3. State Grid Tianjin Electric Power Company High Voltage Branch,Tianjin,China
  4. Contribution: Conceptualization, Methodology, Data curation, Validation
  5. Contribution: Investigation, Validation
  6. Contribution: Validation, Formal analysis
  7. China Electric Power Research Institute,Beijing,China
  8. Contribution: Supervision, Investigation
  9. Contribution: Investigation, Supervision
  10. Department of Mechanical Systems Engineering, Tokyo City University,Tokyo,Japan
  11. ,and
  12. Meng Xiao
  13. Contribution: Project administration, Resources, Writing - review & editing, Funding acquisition
  14. Haosen Du
  15. Contribution: Funding acquisition, Project administration, Resources, Writing - review & editing
- 作者简介：
- 基金信息：
- DOI：10.1049/ema3.70031
  中图分类号：
- 纸质出版：2026
- 稿件说明：
移动端阅览
Liangtian Zhang, Yuyan Chen, Zhaochen Wang, 等. Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors[J]. Electrical Materials and Applications, 2026,3(1).

Liangtian Zhang, Yuyan Chen, Zhaochen Wang, et al. Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors[J]. Electrical Materials and Applications, 2026, 3(1).
Liangtian Zhang, Yuyan Chen, Zhaochen Wang, 等. Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors[J]. Electrical Materials and Applications, 2026,3(1). DOI： 10.1049/ema3.70031.

Liangtian Zhang, Yuyan Chen, Zhaochen Wang, et al. Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors[J]. Electrical Materials and Applications, 2026, 3(1). DOI： 10.1049/ema3.70031.

摘要

The operating temperature of metallised polypropylene film capacitors (MPPFCs) has been steadily increasing. The polypropylene (PP) dielectric film undergoes severe degradation at high temperature constraining system reliability. In this study

accelerated thermal ageing experiments were performed to assess the long-term thermal stability of electron-beam-crosslinked polypropylene (EIPP) films. The effects of ageing at 125°C for up to 600 h on the chemical structure and dielectric properties of pristine PP and EIPP were systematically investigated. For pristine PP

intensified oxidative degradation at high temperature induces molecular chain scission leading to decreased crystallinity and degraded dielectric performance. In contrast

EIPP forms a compact spherulitic morphology and a stable crosslinked network effectively restraining chain mobility and oxygen diffusion. After 600 h of ageing

EIPP exhibits a 53.8% longer oxidation induction time

an electrical conductivity that is only 28.1% of that of pristine PP and a 56.5% enhancement in maximum energy storage density compared with pristine PP. These results demonstrate that electron-beam-induced crosslinking significantly improves the long-term thermal stability of PP films

providing a promising pathway for high-temperature capacitors used in high-voltage direct current systems and DC–DC converters.

Abstract

intensified oxidative degradation at high temperature induces molecular chain scission leading to decreased crystallinity and degraded dielectric performance. In contrast

EIPP forms a compact spherulitic morphology and a stable crosslinked network effectively restraining chain mobility and oxygen diffusion. After 600 h of ageing

EIPP exhibits a 53.8% longer oxidation induction time

providing a promising pathway for high-temperature capacitors used in high-voltage direct current systems and DC–DC converters.

关键词

Keywords

references

浏览量

下载量

CSCD

文章被引用时，请邮件提醒。

提交

工具集

关联资源

Research on the Toughening and Performance of Epoxy Resin for Electrical Packaging

The Temperature Reduction Characteristics of Water Droplets Freezing on Hydrophobic Surface

Low-Temperature Co-Firing and Synergistic Performance Optimisation of Ba(Zr0.2Ti0.8)O3 Ceramics Achieved by Doping With Trace Amounts of BaO–B2O3–SiO2 Glass

Impact of cellulose degradation on space charge dynamics and dielectric properties of Kraft paper impregnated with ester liquid in comparison with mineral oil

Multi-Factor Influence Mechanism of Mechanical Stress Distribution During the Service Life of Large Commercial Soft-Pack Batteries