王利超, 肖仕武, 南东亮, et al. Analysis of Synchronous Condenser’s Fault Tripping Caused by Excitation Inrush Current of Excitation Transformer[J]. 2021, 40(2): 39-43.
王利超, 肖仕武, 南东亮, et al. Analysis of Synchronous Condenser’s Fault Tripping Caused by Excitation Inrush Current of Excitation Transformer[J]. 2021, 40(2): 39-43.DOI:
The synchronous condenser plays an indispensable role in the safe and stable operation of the HVDC. In combination with synchronous condenser’s fault tripping during the debugging process
harmonic mechanism of the excitation system
the reason of magnetizing inrush current during the start-up of the synchronous condenser analyzes in details. Apart from this
the differences of the excitation transformer’s current differential protection during start-up and conventional is also analyzed in this paper. The conclusion has guiding significance for practical engineering.