Cross-linked polyethylene（XLPE） is usually used as an insulating material for HVDC cables due to its excellent electrical properties

but the charge traps formed by its internal defects will lead to the accumulation of space charge

thus accelerating the electrical aging of the insulating material. Based on the effect of charge traps on the electrical aging of XLPE cable insulation

the mechanism of charge traps in the electrical aging process of XLPE cable insulation was investigated

and the effect of charge traps on the electrical aging was quantitatively analyzed by the theory of free energy increment. XLPE films with different charge trap parameters were fabricated by thermal pretreatment. Then

space charge tests and stepping stress tests were carried out to verify the correlation between space charge traps and electric aging process. The results show that

in the electric aging process of XLPE

the density of shallow traps is positively correlated with the aging rate in the electric aging process of materials

while deep traps inhibit the electrical aging process.