李虹, 胡肖飞, 王玉婷, 曾洋斌. 适用于SiC MOSFET的漏源电压积分自适应快速短路保护电路研究[J]. 中国电机工程学报, 2024, 44(4): 1542-1552. DOI: 10.13334/j.0258-8013.pcsee.222996
引用本文: 李虹, 胡肖飞, 王玉婷, 曾洋斌. 适用于SiC MOSFET的漏源电压积分自适应快速短路保护电路研究[J]. 中国电机工程学报, 2024, 44(4): 1542-1552. DOI: 10.13334/j.0258-8013.pcsee.222996
LI Hong, HU Xiaofei, WANG Yuting, ZENG Yangbin. Research on Drain-source Voltage Integration-based Adaptive Fast Short-circuit Protection Circuit for SiC MOSFET[J]. Proceedings of the CSEE, 2024, 44(4): 1542-1552. DOI: 10.13334/j.0258-8013.pcsee.222996
Citation: LI Hong, HU Xiaofei, WANG Yuting, ZENG Yangbin. Research on Drain-source Voltage Integration-based Adaptive Fast Short-circuit Protection Circuit for SiC MOSFET[J]. Proceedings of the CSEE, 2024, 44(4): 1542-1552. DOI: 10.13334/j.0258-8013.pcsee.222996

适用于SiC MOSFET的漏源电压积分自适应快速短路保护电路研究

Research on Drain-source Voltage Integration-based Adaptive Fast Short-circuit Protection Circuit for SiC MOSFET

  • 摘要: SiC MOSFET因其高击穿电压、高开关速度、低导通损耗等性能优势而被广泛应用于各类电力电子变换器中。然而,由于其短路耐受时间仅为2~7 μs,且随母线电压升高而缩短,快速可靠的短路保护电路已成为其推广应用的关键技术之一。为应对不同母线电压下的SiC MOSFET短路故障,文中提出一种基于漏源电压积分的自适应快速短路保护方法(drain-source voltage integration-based adaptive fast short-circuit protection method,DSVI-AFSCPM),研究所提出的DSVI-AFSCPM在硬开关短路(hard switching fault,HSF)和负载短路(fault under load,FUL)条件下的保护性能,进而研究不同母线电压对DSVI-AFSCPM的作用机理。同时,探究SiC MOSFET工作温度对其响应速度的影响。最后,搭建实验平台,对所提出的DSVI-AFSCPM在发生硬开关短路和负载短路时不同母线电压、不同工作温度下的保护性能进行实验测试。实验结果表明,所提出的DSVI-AFSCPM在不同母线电压下具有良好的保护速度自适应性,即母线电压越高,短路保护速度越快,并且其响应速度受SiC MOSFET工作温度影响较小,两种短路工况下工作温度从25℃变化到125℃,短路保护时间变化不超过90 ns。因此,该文为SiC MOSFET在不同母线电压下的可靠使用提供一定技术支撑。

     

    Abstract: SiC MOSFETs have been widely used in various power electronic converters because of their high breakdown voltage, high switching speed, and low switching loss. However, since the short-circuit withstand time of SiC MOSFETs is only 2~7 μs and will be shortened with the increase of bus voltage, a fast and reliable short-circuit protection circuit has become one of the key technologies for their popularization and application. In order to deal with short-circuit faults at different bus voltages, this paper proposes a drain-source voltage integration-based adaptive fast short-circuit protection method (DSVI-AFSCPM). The protection performance of the proposed DSVI-AFSCPM is studied under hard switching fault (HSF) and fault under load (FUL). Furthermore, the action mechanism of different bus voltages on DSVI-AFSCPM is studied. At the same time, the influence of SiC MOSFET operating temperature on its response speed is explored. Finally, an experimental platform is built to test the protection performance of the proposed DSVI-AFSCPM at different bus voltages and operating temperatures under conditions of HSF and FUL. The experimental results show that the DSVI-AFSCPM proposed in this paper has excellent protection speed adaptability at different bus voltages, namely, the higher the bus voltage, the faster the short-circuit protection speed. And its response speed is less affected by the operating temperature of SiC MOSFET. Under the two short-circuit conditions, the operating temperatures change from 25℃ to 125℃, and the short-circuit protection time doesn't change more than 90 ns. Therefore, this paper provides technical support for the reliable use of SiC MOSFET at different bus voltages.

     

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