刘泽浩, 肖岚. 模块化多电平变流器IGBT开路故障诊断与定位方法综述[J]. 中国电机工程学报, 2024, 44(4): 1501-1516. DOI: 10.13334/j.0258-8013.pcsee.222838
引用本文: 刘泽浩, 肖岚. 模块化多电平变流器IGBT开路故障诊断与定位方法综述[J]. 中国电机工程学报, 2024, 44(4): 1501-1516. DOI: 10.13334/j.0258-8013.pcsee.222838
LIU Zehao, XIAO Lan. Review of IGBT Open-circuit Fault Diagnosis and Localization Methods for Modular Multilevel Converter[J]. Proceedings of the CSEE, 2024, 44(4): 1501-1516. DOI: 10.13334/j.0258-8013.pcsee.222838
Citation: LIU Zehao, XIAO Lan. Review of IGBT Open-circuit Fault Diagnosis and Localization Methods for Modular Multilevel Converter[J]. Proceedings of the CSEE, 2024, 44(4): 1501-1516. DOI: 10.13334/j.0258-8013.pcsee.222838

模块化多电平变流器IGBT开路故障诊断与定位方法综述

Review of IGBT Open-circuit Fault Diagnosis and Localization Methods for Modular Multilevel Converter

  • 摘要: 随着模块化多电平变流器(modular multilevel converter,MMC)在工程领域中广泛应用,绝缘栅双极型晶体管(insulated gate bipolar transistors,IGBT)开路故障问题日益突出,并成为制约其稳定运行的主要因素。IGBT开路故障诊断与定位方法作为及时识别开路故障,保证MMC持续稳定运行的主要手段而被广泛研究。文中首先对MMC的基本结构及IGBT开路故障特征进行介绍和分析,阐明故障子模块电流路径及电容电压变化趋势;其次,以定位故障IGBT使用的方法和手段为依据,对国内外相关主要文献进行分类和归纳,总结不同类型故障诊断方法的优点和不足;最后,对MMC开路故障诊断与定位方法的未来发展方向和趋势进行展望,指出基于硬件、基于模型和基于人工智能的3类诊断方案分别在降低硬件复杂度、提高故障诊断准确率和降低计算量等方面应该重点解决的主要问题和思路。

     

    Abstract: With the modular multilevel converter (MMC) widely applicable in different engineering fields, the IGBT open circuit fault has become increasingly prominent, and it has become the main factor restricting its stable operation. The IGBT open-circuit fault diagnosis and localization method (FDL), as the main means to identify faults, can guarantee the continuous operation of MMC. First, this paper introduces the basic structure of MMC. At the same time, the characteristics of MMC under IGBT open-circuit fault are analyzed, where the current path of the faulty sub-module (SM) and the changing trend of capacitor voltage are clarified. Then, the main literatures are classified according to the means used to locate faulty IGBTs, and the advantages and disadvantages of different FDL methods are summarized. Finally, the future development and trend of MMC open circuit fault diagnosis and location methods are prospected. The main problems and ideas that should be solved in hardware-based, model-based and artificial intelligence-based diagnosis schemes in reducing hardware complexity, improving fault diagnosis accuracy and reducing computational load are pointed out.

     

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