赵雨山, 邓二平, 陈彦, 谢露红, 陈杰, 张一鸣, 黄永章. 电动汽车用IGBT全桥模块(6 in 1)的热耦合作用机制[J]. 中国电机工程学报, 2021, 41(10): 3528-3535. DOI: 10.13334/j.0258-8013.pcsee.201025
引用本文: 赵雨山, 邓二平, 陈彦, 谢露红, 陈杰, 张一鸣, 黄永章. 电动汽车用IGBT全桥模块(6 in 1)的热耦合作用机制[J]. 中国电机工程学报, 2021, 41(10): 3528-3535. DOI: 10.13334/j.0258-8013.pcsee.201025
ZHAO Yushan, DENG Erping, CHEN Yan, XIE Luhong, CHEN Jie, ZHANG Yiming, HUANG Yongzhang. Thermal Coupling Mechanism of IGBT Full-bridge Module (6 in 1) for Electric Vehicles[J]. Proceedings of the CSEE, 2021, 41(10): 3528-3535. DOI: 10.13334/j.0258-8013.pcsee.201025
Citation: ZHAO Yushan, DENG Erping, CHEN Yan, XIE Luhong, CHEN Jie, ZHANG Yiming, HUANG Yongzhang. Thermal Coupling Mechanism of IGBT Full-bridge Module (6 in 1) for Electric Vehicles[J]. Proceedings of the CSEE, 2021, 41(10): 3528-3535. DOI: 10.13334/j.0258-8013.pcsee.201025

电动汽车用IGBT全桥模块(6 in 1)的热耦合作用机制

Thermal Coupling Mechanism of IGBT Full-bridge Module (6 in 1) for Electric Vehicles

  • 摘要: 电动汽车用IGBT全桥模块具有高功率密度和结构紧凑的特点,瞬态热阻抗测试是建立IGBT全桥模块的热网络模型的必要手段。单独加热IGBT或FRD的方法测试瞬态热阻抗并未考虑实际工况中IGBT全桥模块的热耦合作用,而热耦合很大程度上会影响基于热网络模型的结温评估的精确性。建立电动汽车用IGBT全桥模块的有限元模型,并对芯片与芯片、芯片与桥臂以及相与相的热耦合作用进行热学分析,同时分析热耦合作用对瞬态热阻抗测试结果的影响,与实际工况的热传导特性进行比较。结果表明,实际工况中芯片与同桥臂芯片的热耦合最为强烈,芯片与桥臂、相与相的热耦合作用较弱。最后结合实际工况,提出接近实际工况的热分布。

     

    Abstract: The insulated gate bipolar transistor (IGBT) full-bridge module (6 in 1) for electric vehicles has the characteristics of high-power density and compact structure. Transient thermal impedance test is a necessary means to establish the thermal network model of IGBT full-bridge module. The method of heating IGBT or FRD separately to test transient thermal impedance does not consider the thermal coupling effect of IGBT full-bridge module in actual working condition, and thermal coupling will largely affect the accuracy of junction temperature evaluation based on thermal network model. The finite element simulation model of full-bridge module for electric vehicle was established, and the thermal analysis of chips and chips, chips and arms and phase to phase thermal coupling was carried out. At the same time, the influence of thermal coupling on the transient thermal impedance test results was analyzed, and the thermal conductivity characteristics of the module were compared with the actual working conditions. The results show that the thermal coupling between chips in the same bridge arm is the stronger, and the thermal coupling between chips and bridge arm and between phases is weak. Finally, combined with the actual working condition, the heat distribution close to the actual working condition was proposed.

     

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