赵军, 陈维江, 张建功, 李志兵, 王磊. 计及套管导体辐射损耗的VFTO计算方法[J]. 中国电机工程学报, 2016, 36(13): 3692-3698,3390. DOI: 10.13334/j.0258-8013.pcsee.152178
引用本文: 赵军, 陈维江, 张建功, 李志兵, 王磊. 计及套管导体辐射损耗的VFTO计算方法[J]. 中国电机工程学报, 2016, 36(13): 3692-3698,3390. DOI: 10.13334/j.0258-8013.pcsee.152178
ZHAO Jun, CHEN Weijiang, ZHANG Jiangong, LI Zhibing, WANG Lei. VFTO Calculation Method Considering Radiation Loss of Bushing Conductor[J]. Proceedings of the CSEE, 2016, 36(13): 3692-3698,3390. DOI: 10.13334/j.0258-8013.pcsee.152178
Citation: ZHAO Jun, CHEN Weijiang, ZHANG Jiangong, LI Zhibing, WANG Lei. VFTO Calculation Method Considering Radiation Loss of Bushing Conductor[J]. Proceedings of the CSEE, 2016, 36(13): 3692-3698,3390. DOI: 10.13334/j.0258-8013.pcsee.152178

计及套管导体辐射损耗的VFTO计算方法

VFTO Calculation Method Considering Radiation Loss of Bushing Conductor

  • 摘要: 特高压交流试验基地特快速瞬态过电压(very fast transient overvoltage,VFTO)试验回路研究发现,计算得到的VFTO单次击穿波形的衰减时间超过了实测值,对于通过仿真计算提取VFTO标准波形的半波时间取值影响较大,需要开展损耗机制的研究。对于CIGRE推荐模型和现有文献中对套管处辐射损耗的考虑不足,首先分析了套管导体电流分布的行波模式,推导了辐射电阻和平均特征阻抗的计算公式,建立了计及辐射损耗的套管传输线模型;然后针对辐射电阻这一频变参数问题,提出了VFTO频域计算方法;最后对VFTO试验回路的计算发现,套管导体的辐射电阻在波形主频处远大于电弧电阻和GIS母线电阻,同时计算波形的衰减时间更接近实测波形,因此验证了所提出的计算方法的合理性。

     

    Abstract: Through research in very fast transient overvoltage(VFTO) test circuit of UHV AC test base, it is found that the decay time of calculated VFTO single breakdown waveform is more than that of measured waveform. This result will affect the evaluation of hemi-wave time of VFTO standard waveform through simulation. So the research of loss mechanism is needed. Based on the poor considering of radiation loss of bushing conductor in CIGRE recommended model and other literatures, this paper firstly analyzed the traveling wave mode of current distribution on bushing conductor, deduced the calculation formula of radiation resistance and average characteristic impedance of bushing conductor and build transmission model of bushing considering radiation loss. Then the frequency domain calculation method of VFTO was proposed in order to handle the frequency dependent parameter of radiation resistance. The calculation results in VFTO test circuit show that the radiation resistance of bushing conductor is much bigger than the arc resistance and the bus-bar resistance at main frequencies, and meanwhile the decay time is much more close to that of the measured waveform. Therefore the rationality of the proposed calculation method has been verified.

     

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