Abstract: Gate line etallization has always been one of the key paths in the continuous process of improving efficiency and reducing costs in solar cells. The busbar structure of solar cells has undergone an evolution from the conventional 2～6 busbars scheme to the multi 12～24 busbars,and the busbarless scheme has also been introduced in the industry since 2022. The conventional probe array testing scheme in I-V testing is based on the probe collecting electrical performance parameters on the busbar to achieve I-V testing,which has a design mismatch with the busbarless scheme and cannot achieve I-V testing of busbarless solar cells. Therefore,our company has developed a testing system suitable for busbarless and multiple busbar,ensuring reliable contact between the testing fixture and the finger during the testing process,and achieving accurate testing of I-V characteristics. Meanwhile,through the optimal design of structure and materials,the reliability and stability of the overall testing system also meet the requirements of mass production testing.