刘晓波, 陈志勇, 李月文, 王珂, 高云峰. 智能型变压器试验接线箱的研制与应用[J]. 内蒙古电力技术, 2022, 40(1): 83-87. DOI: 10.19929/j.cnki.nmgdljs.2022.0017
引用本文: 刘晓波, 陈志勇, 李月文, 王珂, 高云峰. 智能型变压器试验接线箱的研制与应用[J]. 内蒙古电力技术, 2022, 40(1): 83-87. DOI: 10.19929/j.cnki.nmgdljs.2022.0017
LIU Xiaobo, CHEN Zhiyong, LI Yuewen, WANG Ke, GAO Yunfeng. Development and Application of Intelligent Transformer Test Junction Box[J]. Inner Mongolia Electric Power, 2022, 40(1): 83-87. DOI: 10.19929/j.cnki.nmgdljs.2022.0017
Citation: LIU Xiaobo, CHEN Zhiyong, LI Yuewen, WANG Ke, GAO Yunfeng. Development and Application of Intelligent Transformer Test Junction Box[J]. Inner Mongolia Electric Power, 2022, 40(1): 83-87. DOI: 10.19929/j.cnki.nmgdljs.2022.0017

智能型变压器试验接线箱的研制与应用

Development and Application of Intelligent Transformer Test Junction Box

  • 摘要: 针对变压器试验仪器的连接线箱内部摆放杂乱,找线、理线而导致变压器试验准备及收尾用时长的问题,研制了智能型变压器试验接线箱。线箱以STC89C52单片机为基础设计核心控制电路,利用霍尔开关作为开箱触发单元,按照功能需求制作控制面板,并安装了与连接线匹配的固定插槽。试验接线箱具有分类放置、固定设备、自动检测、视觉识别等多种功能。智能型变压器试验接线箱使用后,变压器试验准备及收尾用时由69 min缩短为37.2 min,平均节省时间31.8 min,同时有效避免了相关电力安全事故的发生,提高了试验人员的工作效率。

     

    Abstract: According to the disorderly arrangement of the connecting wire box of transformer test instrument, the problems of transformer test preparation and finishing time caused by finding and arranging wires are systematically analyzed, and an intelligent transformer test junction box is developed. The core control circuit of test junction box is designed based on STC89C52 single chip microcontroller, taking Hall switch as the open-box trigger unit, making the control panel according to the functional requirements, and installing the fixed slot matched with the connection line. The test junction box has various functions such as classified placement, fixed equipment, automatic detection, visual identification and so on. After the use of the test junction box, the transformer test preparation and closing time is shortened from 69 min to 37.2 min, saving an average of 31.8 min, which effectively avoiding related electrical safety accidents, and improving the working efficiency of testers.

     

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