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ZHANG Yongchang, XU Hongyan, LIU Mingming. Development of a Microcomputer Protection Trip Logic Testing Device[J]. Rural Electrification, 2025, (4): 86-89. DOI: 10.13882/j.cnki.ncdqh.2212A011
Citation: ZHANG Yongchang, XU Hongyan, LIU Mingming. Development of a Microcomputer Protection Trip Logic Testing Device[J]. Rural Electrification, 2025, (4): 86-89. DOI: 10.13882/j.cnki.ncdqh.2212A011

Development of a Microcomputer Protection Trip Logic Testing Device

  • In response to the problems of time-consuming and labor-intensive testing of various protection trip outlet circuits and long power outage time in the acceptance of microcomputer protection renovation for 220 kV and above, a PLC programmable outlet pressure plate circuit tester is proposed. Combined with the microcomputer protection tester, the PLC internal program can simultaneously collect the potential change time limits of up to 4 trip outlet pressure plates, and display and record them separately through the human-machine interface, making the trip time limits of each circuit of the protection outlet pressure plate clear at a glance, greatly improving the debugging efficiency of complex microcomputer protection for 220 kV and above.
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