Abstract: High temperature reliability tests such as High Temperature Gate Bias（HTGB）, High Temperature Reverse Bias（HTRB） and High Humidity High Temperature Reverse Bias（H3TRB） are essential tests for device lifetime evaluation. However, the test conditions vary from standard to standard, and the corresponding intrinsic mechanism is not clear. In order to discuss the principles for determining the test conditions, we started from the single or coupled accelerated aging models of temperature, electric field and humidity, discussed the models used in relevant test standards, and analyzed the applying range and using principle of every life model. Furthermore, we summarized the existing standard test conditions and calculated that the accelerated aging test time of HTGB, HTRB, H3TRB required for 30 years of normal operation of electric vehicle modules as 832 h, 866 h, 1 038 h respectively, and the number of samples tested were 70. It points out that test time and sample size should be determined by actual working conditions. Finally, based on the analysis above, the test flow for high temperature reliability test is proposed, which is adjustable for testing time and sample size.