贾博文, 王哲铭, 王耀港, 杨华, 许红运, 卢武. 考虑静态金属微粒下的直流GIL绝缘子表面电荷仿真:微放电下的离散电荷斑[J]. 高电压技术, 2025, 51(3): 1080-1091. DOI: 10.13336/j.1003-6520.hve.20240866
引用本文: 贾博文, 王哲铭, 王耀港, 杨华, 许红运, 卢武. 考虑静态金属微粒下的直流GIL绝缘子表面电荷仿真:微放电下的离散电荷斑[J]. 高电压技术, 2025, 51(3): 1080-1091. DOI: 10.13336/j.1003-6520.hve.20240866
JIA Bowen, WANG Zheming, WANG Yaogang, YANG Hua, XU Hongyun, LU Wu. Simulation of Surface Charge on DC GIL Insulator in Consideration of Static Metal Particles: Discrete Charge Spots Under Micro-discharge[J]. High Voltage Engineering, 2025, 51(3): 1080-1091. DOI: 10.13336/j.1003-6520.hve.20240866
Citation: JIA Bowen, WANG Zheming, WANG Yaogang, YANG Hua, XU Hongyun, LU Wu. Simulation of Surface Charge on DC GIL Insulator in Consideration of Static Metal Particles: Discrete Charge Spots Under Micro-discharge[J]. High Voltage Engineering, 2025, 51(3): 1080-1091. DOI: 10.13336/j.1003-6520.hve.20240866

考虑静态金属微粒下的直流GIL绝缘子表面电荷仿真:微放电下的离散电荷斑

Simulation of Surface Charge on DC GIL Insulator in Consideration of Static Metal Particles: Discrete Charge Spots Under Micro-discharge

  • 摘要: 气体绝缘输电线路(gas insulated transmission line,GIL)在生产、运输、安装及运行过程中,不可避免地会受到金属微粒的污染,影响绝缘子表面电荷积聚,严重降低其绝缘水平。为此在考虑气体侧带电粒子产生、复合和迁移等物理过程的基础上,额外考虑了金属微粒及其微放电的影响,建立了气体侧电荷注入为主导因素的直流GIL气-固界面电荷积聚的时变三维模型,并对中心电极附着金属微粒的GIL几何模型中电荷积聚进行了数值计算。仿真结果表明:金属微粒的存在会畸变周围的电场分布并改变绝缘子表面电荷分布;在理想条件下绝缘子气-固界面电荷主要以电晕形态分布,当中心电极上附着金属微粒时,会促进绝缘子表面电荷积聚进程以及双极性离散电荷斑的出现;此外,金属微粒正下方绝缘子区域的平均电荷密度与无金属微粒的相比要小约10.4%;另外,经对绝缘子表面法向电场特征的对比分析,发现金属微粒的存在会导致表面法向电场不均匀分布。

     

    Abstract: Gas insulated transmission line(GIL) is inevitably contaminated by metal particles during production, transportation, installation, and operation, which affects the charge accumulation on the insulator surface and seriously reduces the insulation level of GIL. In this paper, based on the considerations of physical processes such as charge carrier generation, recombination, and migration on the gas-side, the effects of metallic particles and their micro-discharges are additionally taken into account, thus a time-varying 3-D numerical model of charge accumulations at the gas-solid interface of DC GIL with gas-side charge injection in dominance is developed. Meanwhile, numerical calculations of charge accumulation in the GIL geometrical model with metal particles attached to the center conductor are performed. The simulation results indicate that the presence of metallic particles distorts the surrounding electric field distribution and alters the surface charge distribution on the insulator. Under ideal conditions, the charge at the gas-solid interface of the insulator mainly exhibits a halo-shaped distribution. When metallic particles are attached to the central conductor, they accelerate the charge accumulation process on the insulator surface and promote the appearance of bipolar discrete charge spots. Additionally, the average charge density in the insulator region directly below the metallic particles is approximately 10.4% lower compared to that in the absence of metallic particles. Furthermore, a comparative analysis of the normal electric field characteristics on the insulator surface reveals that the presence of metallic particles causes an uneven distribution of the normal electric field on insulator surface.

     

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