王乾, 高岩峰, 韩迎强, 周颖, 仵超, 梁曦东. 低损耗电介质中平坦介电响应的微观物理机制与数值分析方法[J]. 高电压技术, 2025, 51(1): 299-308. DOI: 10.13336/j.1003-6520.hve.20232150
引用本文: 王乾, 高岩峰, 韩迎强, 周颖, 仵超, 梁曦东. 低损耗电介质中平坦介电响应的微观物理机制与数值分析方法[J]. 高电压技术, 2025, 51(1): 299-308. DOI: 10.13336/j.1003-6520.hve.20232150
WANG Qian, GAO Yanfeng, HAN Yingqiang, ZHOU Ying, WU Chao, LIANG Xidong. Physical Significance and Analytical Method of Flat Dielectric Response in Low Loss Dielectrics[J]. High Voltage Engineering, 2025, 51(1): 299-308. DOI: 10.13336/j.1003-6520.hve.20232150
Citation: WANG Qian, GAO Yanfeng, HAN Yingqiang, ZHOU Ying, WU Chao, LIANG Xidong. Physical Significance and Analytical Method of Flat Dielectric Response in Low Loss Dielectrics[J]. High Voltage Engineering, 2025, 51(1): 299-308. DOI: 10.13336/j.1003-6520.hve.20232150

低损耗电介质中平坦介电响应的微观物理机制与数值分析方法

Physical Significance and Analytical Method of Flat Dielectric Response in Low Loss Dielectrics

  • 摘要: 在对聚合物的研究中发现,许多低损耗电介质的介电响应虚部中存在跨越较大温度和频率范围的“平坦”区间。现有的理论模型无法对该现象做出解释,造成数据处理和分析的困难。针对以上问题,通过测量在薄膜电容器中广泛应用的双轴拉伸聚丙烯(biaxially-oriented polypropylene, BOPP)在宽温度和频率范围内的介电响应特性,证实了平坦介电响应的存在,并确定了其基本条件和特征。在此基础上,提出了平坦介电响应的数值分析方法,并通过对BOPP薄膜介电响应的定量解耦进行了验证。同时,该方法能够与现有的Dissado-Hill模型兼容,从而显著提高了其可用性。最后,基于偶极子的微观屏蔽效应,提出了宏观平坦介电响应现象的微观物理解释,以及该分析方法的适用范围。

     

    Abstract: During the investigation of polymer dielectrics, flat responses which overleap large temperature and frequency ranges can be found in various low loss dielectrics. It cannot be demonstrated by the current theoretical models such as Dissado-Hill model, resulting in the dilemma of data processing and analysis. Therefore, the dielectric response of biaxially-oriented polypropylene (BOPP) over broad temperature and frequency ranges are measured, which is widely used in film capacitors. The existence of flat dielectric response is confirmed, with its general conditions and features being demonstrated. Besides, the numerical analytical method is proposed towards flat dielectric response, validated by the quantitative decoupling of the dielectric response of BOPP film. The method proposed is compatible with the current Dissado-Hill model, thus increasing the feasibility significantly. Furthermore, according to the analysis of microscopic dipolar screening, the physical interpretation of flat dielectric response is proposed, based on which the scope of method is specified.

     

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