张明泽, 韩嘉言, 王炳杰, 吴永康, 袁田. 低温环境条件下电力设备红外测温缺陷识别方法[J]. 高电压技术, 2024, 50(6): 2726-2733. DOI: 10.13336/j.1003-6520.hve.20232133
引用本文: 张明泽, 韩嘉言, 王炳杰, 吴永康, 袁田. 低温环境条件下电力设备红外测温缺陷识别方法[J]. 高电压技术, 2024, 50(6): 2726-2733. DOI: 10.13336/j.1003-6520.hve.20232133
ZHANG Mingze, HAN Jiayan, WANG Bingjie, WU Yongkang, YUAN Tian. Identification Method for Infrared Temperature Measurement Defects in Power Equipment Under Low-temperature Environment[J]. High Voltage Engineering, 2024, 50(6): 2726-2733. DOI: 10.13336/j.1003-6520.hve.20232133
Citation: ZHANG Mingze, HAN Jiayan, WANG Bingjie, WU Yongkang, YUAN Tian. Identification Method for Infrared Temperature Measurement Defects in Power Equipment Under Low-temperature Environment[J]. High Voltage Engineering, 2024, 50(6): 2726-2733. DOI: 10.13336/j.1003-6520.hve.20232133

低温环境条件下电力设备红外测温缺陷识别方法

Identification Method for Infrared Temperature Measurement Defects in Power Equipment Under Low-temperature Environment

  • 摘要: 输变电系统中采用红外线设备进行运维诊断时要求环境温度大于0 ℃,但对于东北地区冬季低温环境下带电设备缺少红外诊断相关依据,因此需对典型电气设备/连接件的金属接触点温度与环境温度的关系开展研究。本文在实验室环境下搭建了低温环境红外测试系统,获得了不同环境温度时设备金属接触点温度的变化规律,揭示了3种接触电阻在不同负荷电流、环境温度时对测试温度的影响规律。测试结果表明:当接触电阻小于20 μΩ时,环境温度、负载电流对接触点温度梯度的变化几乎无影响;而当接触电阻大于20 μΩ时,负载电流的影响显著增加,且0 ℃可作为温度梯度变化的分界点。基于此在考虑接触电阻下提出了低温红外测温的修正方法,可修正低温环境对红外测温结果的影响,文中的分析及试验结果为低温环境下红外检测时结果的修正提供了实践依据,同时准确判断电气设备接触异常等问题,为高寒地区电气设备运维策略的制定提供重要理论支撑。

     

    Abstract: When infrared equipment is used for operation and maintenance diagnosis in power transmission and transformation systems, it is required that the ambient temperature be greater than 0 ℃. However, there is a lack of infrared diagnostic basis for live equipment in low-temperature winter environments in Northeast China. Therefore, it is necessary to study the relationship between the metal contact point temperature of typical electrical equipment/connectors and the ambient temperature. This paper builds a low-temperature infrared testing system in a laboratory environment, obtains the variation law of metal contact point temperature of the equipment at different environmental temperatures, and reveals the influences of three contact resistances on the testing temperature under different load currents and environmental temperatures. The test results indicate that, when the contact resistance is less than 20 μΩ, the environmental temperature and load current have hardly any effect on the temperature gradient of the contact point. And when the contact resistance is greater than 20 μΩ, the influence of load current significantly increases, and 0 ℃ can serve as the boundary point for temperature gradient changes. Thereby, a correction method for low-temperature infrared temperature measurement is proposed after considering contact resistance, which can correct the influence of low-temperature environment on infrared temperature measurement results. The analysis and experimental results in this paper provide a practical basis for correcting infrared detection results in low-temperature environments. The research results of this paper can accurately determine problems such as abnormal contact of electrical equipment, and provide important theoretical support for the formulation of maintenance strategies for electrical equipment in alpine region.

     

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