Aiming at the issue of the impact of ultraviolet-induced degradation (UVID) on the power generation capacity of n-type TOPCon photovoltaic modules
a method for evaluating photovoltaic modules based on the simulation of UVID process by working condition characteristics is proposed. This method enables a more comprehensive study of the UVID characteristics and grid-connected power generation capacity of TOPCon modules
making up for the deficiency of traditional single-factor component UVID evaluation methods. The research finds that ultraviolet light can activate the metastable characteristics in n-type TOPCon photovoltaic modules and cause fluctuations in the output power of the modules. The main reasons are the defects at the Si/SiO interface
the refractive index of SiN
and the changes in the charge of the field-passivation AlO film. Under light-soaking conditions
using TOPCon cells with high refractive index passivation medium films or UV-cutting adhesive films for module encapsulation can effectively suppress the metastable phenomenon of TOPCon modules. Based on outdoor power generation data analysis
the proposed method can more accurately evaluate the power generation characteristics of TOPCon modules compared to traditional photovoltaic module UVID aging evaluation methods.
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