TANG Xin, XIONG Yun, MAO Xuefeng, et al. Experimental Study on High Voltage Dielectric Loss of Shunt Capacitor for 500 kV Circuit Breaker[J]. 2022, 42(6): 110-113.
TANG Xin, XIONG Yun, MAO Xuefeng, et al. Experimental Study on High Voltage Dielectric Loss of Shunt Capacitor for 500 kV Circuit Breaker[J]. 2022, 42(6): 110-113. DOI: 10.3969/j.issn.1008-0198.2022.06.019.
Experimental Study on High Voltage Dielectric Loss of Shunt Capacitor for 500 kV Circuit Breaker
Conventional dielectric loss tests for coupling capacitor often yield values that exceed the standards. After analysis and verification
it is found that the Garton effect of the insulating medium inside the capacitors is the main reason for the abnormal dielectric loss at low voltage
which cannot reflect the real insulation defect inside the capacitor. Through the high-voltage dielectric loss test
it could be observed that the dielectric loss value of the capacitors changes regularly with increasing test voltage. When the voltage drops back to 10kV
compared with initial values
the dielectric loss values decreased significantly. In this method
the influence of the Garton effect on the actual dielectric loss value has been reduced
which also provides an effective basis for judging whether there is a real insulation abnormality in the breaker capacitance.