Zhao Qian, Xu Dongwei, Miao Zhengli, et al. CONSTRUCTION OF PLATFORM FOR DEFECT DETECTION AND ALGORITHM RESEARCH ON INNER WALL OF QUARTZ CRUCIBLES[J]. 2025, 46(3): 421-427.
Zhao Qian, Xu Dongwei, Miao Zhengli, et al. CONSTRUCTION OF PLATFORM FOR DEFECT DETECTION AND ALGORITHM RESEARCH ON INNER WALL OF QUARTZ CRUCIBLES[J]. 2025, 46(3): 421-427. DOI: 10.19912/j.0254-0096.tynxb.2023-1923.
CONSTRUCTION OF PLATFORM FOR DEFECT DETECTION AND ALGORITHM RESEARCH ON INNER WALL OF QUARTZ CRUCIBLES
the defects of quartz crucible mainly use manual eye inspection
which can not complete the accurate classification and full count only by manual. In this paper
a set of quartz crucible defect detection platform was built by using a 6-DOF manipulator and a rotating table
and high resolution images of crucible defects were obtained by combining backlight source and high speed camera. Simultaneously
the paper proposes an improved YOLOv5 algorithm for detecting crucible defects
capable of identifying various defect types such as impurity black spots
bubbles
and white spots. Firstly
K means clustering algorithm is used to generate anchor box suitable for crucible defect data sets
and then small target detection layer is added to improve the detection effect of small targets. Finally
omni-Dimensional dynamic convolution (ODConv) and the efficient channel attention (ECA) are used to make the network pay more attention to the targets to be detected without increasing too much computation. The experimental results show that in the self-built quartz crucible defect data set
the improved algorithm mAP@0.5 is 98.88% and the detection speed reaches 138 fps
which can meet the requirements of industrial detection.
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references
WARDEN G K, JUEL M, GAWEŁ B A, et al.Recent developments on manufacturing and characterization of fused quartz crucibles for monocrystalline silicon for photovoltaic applications[J]. Open ceramics, 2023, 13: 100321.
BETEKBAEV A A, MUKASHEV B N, PELISSIER L, et al.Comparison of the characteristics of solar cells fabricated from multicrystalline silicon with those fabricated from silicon obtained by the monolike technology[J]. Semiconductors, 2016, 50(8): 1085-1091.