Zhang Xu, Guo Cong, Chen Tao, et al. STUDY ON EFFECT OF SUBSTRATE TEMPERATURE ON TUNGSTEN OXIDE FILMS BY HOT-WIRE CVD DEPOSITION[J]. 2025, 46(3): 335-341.
Zhang Xu, Guo Cong, Chen Tao, et al. STUDY ON EFFECT OF SUBSTRATE TEMPERATURE ON TUNGSTEN OXIDE FILMS BY HOT-WIRE CVD DEPOSITION[J]. 2025, 46(3): 335-341. DOI: 10.19912/j.0254-0096.tynxb.2023-1770.
STUDY ON EFFECT OF SUBSTRATE TEMPERATURE ON TUNGSTEN OXIDE FILMS BY HOT-WIRE CVD DEPOSITION
摘要
通过热丝化学气相沉积法制备氧化钨(WO
x
)薄膜
并将其应用于无掺杂异质结太阳电池。研究表明
衬底温度在沉积过程中起着重要作用
衬底温度从室温升高到200 ℃
WO
x
薄膜的表面颗粒尺寸减小
薄膜更加致密;功函数先升高再迅速下降;透过率在150 ℃以内无明显变化
继续升高温度后迅速降低。通过取代p型非晶硅层
将其应用于无掺杂硅异质结太阳电池中作为空穴选择接触层。在衬底温度为100 ℃的条件下
利用高透明的WO
x
层
获得最佳转换效率为14.63%的太阳电池。
Abstract
Tungsten oxide (WO
x
) thin films were prepared via hot-wire chemical vapor deposition and applied to dopant-free silicon heterojunction solar cells. It was found that substrate temperature played a crucial role during the deposition process. As the substrate temperature increased from room temperature to 200 ℃
the surface particle size of the WO
x
thin film decreased
and the film became denser. The work function first increased and then rapidly decreased. The transmittance showed no significant change when the temperature lower than 150 ℃
but rapidly decreased as the further increased temperature. By replacing the p-type amorphous silicon layer
it was applied to dopant-free silicon heterojunction solar cells as a hole-selective contact layer. Under the condition of a substrate temperature of 100 ℃
the
highest conversion efficiency of 14.63% was achieved at the substrate temperature of 100 ℃. This work demonstrated the feasibility and great potential of preparing WO
x
by hot-wire chemical vapor deposition for high-efficiency dopant-free silicon heterojunction solar cells.
关键词
Keywords
references
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