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Application of Comprehensive Diagnosis Method for Internal Discharge Defects of GIS Supporting Insulator
更新时间:2026-02-13
    • Application of Comprehensive Diagnosis Method for Internal Discharge Defects of GIS Supporting Insulator

    • Issue 5, Pages: 54-58(2021)
    • DOI:10.16527/j.issn.1003-6954.20210511    

      CLC: TM855
    • Published:2021

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  • Dai Hui, Xiong Pan, Zhou Dianbo, et al. Application of Comprehensive Diagnosis Method for Internal Discharge Defects of GIS Supporting Insulator[J]. 2021, (5): 54-58. DOI: 10.16527/j.issn.1003-6954.20210511.

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