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Collaborative optimization of switching performance and gate reliability for SiC MOSFET under voltage-source gate driver
更新时间：2026-10-11

    • Collaborative optimization of switching performance and gate reliability for SiC MOSFET under voltage-source gate driver

    • Electric Machines and Control   Vol. 29, Issue 5, Pages: 144-156(2025)

    • DOI：10.15938/j.emc.2025.05.014    

      CLC： TM464

    • Received：30 April 2024，

      Published：2025-05

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  • XIANG Pengfei, HAO Ruixiang, WANG Deshun, et al. Collaborative optimization of switching performance and gate reliability for SiC MOSFET under voltage-source gate driver[J]. Electric Machines and Control, 2025, 29(5): 144-156. DOI： 10.15938/j.emc.2025.05.014.

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