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Method for remaining useful life prediction for IGBTs under variable stress conditions based on similarity of degradation
更新时间：2025-10-13

    • Method for remaining useful life prediction for IGBTs under variable stress conditions based on similarity of degradation

    • Electric Machines and Control   Vol. 29, Issue 2, Pages: 105-115(2025)

    • DOI：10.15938/j.emc.2025.02.011    

      CLC： TM46

    • Received：24 October 2024，

      Published：2025-02

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  • QIU Zhijie, ZHENG Dan, FAN Tao, et al. Method for remaining useful life prediction for IGBTs under variable stress conditions based on similarity of degradation[J]. Electric Machines and Control, 2025, 29(2): 105-115. DOI： 10.15938/j.emc.2025.02.011.

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