NIU Feng, ZHANG Boheng, LI Guiheng, et al. Performance degradation and reliability of leakage signal conditioning circuit based on accelerated degradation test[J]. Electric Machines and Control, 2024, 28(1): 61-68.
DOI:
NIU Feng, ZHANG Boheng, LI Guiheng, et al. Performance degradation and reliability of leakage signal conditioning circuit based on accelerated degradation test[J]. Electric Machines and Control, 2024, 28(1): 61-68. DOI: 10.15938/j.emc.2024.01.006.
Performance degradation and reliability of leakage signal conditioning circuit based on accelerated degradation test
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