Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage

LI Dengdiao; YUAN Kaipu; ZHOU Qindi

doi:10.13882/j.cnki.ncdqh.2601A046

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Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage

更新时间：2026-07-22

- Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage
- Rural Electrification Issue 6, Pages: 84-88(2026)
- 作者机构：
  
  国网浙江省电力有限公司仙居县供电公司，浙江仙居,317300
- 作者简介：
- 基金信息：
- DOI：10.13882/j.cnki.ncdqh.2601A046
  CLC： TM71
- Published：2026
- 稿件说明：
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李登雕, 苑凯普, 周琴弟. 低压漏电越级跳闸故障定位装置研制[J]. 农村电气化, 2026, (6): 84-88.

LI Dengdiao, YUAN Kaipu, ZHOU Qindi. Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage[J]. Rural Electrification, 2026, (6): 84-88.
李登雕, 苑凯普, 周琴弟. 低压漏电越级跳闸故障定位装置研制[J]. 农村电气化, 2026, (6): 84-88. DOI： 10.13882/j.cnki.ncdqh.2601A046.

LI Dengdiao, YUAN Kaipu, ZHOU Qindi. Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage[J]. Rural Electrification, 2026, (6): 84-88. DOI： 10.13882/j.cnki.ncdqh.2601A046.

摘要

为了解决低压漏电定位效率低的问题，文章研制了一种专为防止表箱漏电引发频繁停电的低压漏电越级跳闸故障定位装置，装置通过低压交流磁吸取电接头、多路电压电流监测单元、智能算法与微应用系统集成，实现了漏电故障的精准监测与快速定位，具备安装便捷、运行安全、数据连续和响应快速的特点，提高报修速度和客户满意度，具有显著的技术优势和实用价值。

Abstract

To address the low efficiency of low-voltage leakage location

this paper develops a fault location device for upstream tripping caused by low-voltage leakage

which is specifically designed to prevent frequent power outages caused by leakage in meter boxes. By integrating low-voltage AC magnetic power tapping connectors

multiple voltage and current monitoring units

intelligent algorithms

and a micro application system

the device realizes accurate monitoring and rapid location of leakage faults. It features convenient installation

safe operation

continuous data acquisition

and fast response

thereby accelerating fault reporting and repair response and improving customer satisfaction. The device has significant technical advantages and practical value.

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references

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