WEI Peng, WANG Shaokang, BI Yinkai, et al. Early Fault Detection and Localization of Li-ion Battery Packs Based on Improved Local Gravitation Analysis[J]. 2026, 46(18): 6845-6853.
DOI:
WEI Peng, WANG Shaokang, BI Yinkai, et al. Early Fault Detection and Localization of Li-ion Battery Packs Based on Improved Local Gravitation Analysis[J]. 2026, 46(18): 6845-6853.DOI: 10.13334/j.0258-8013.pcsee.250653.
Early Fault Detection and Localization of Li-ion Battery Packs Based on Improved Local Gravitation Analysis
摘要
在长期服役过程中,锂离子电池(Li-ion battery,LIB)内部复杂的化学反应与物理过程可能引发故障,进而危及系统安全。因此,精准、高效地检测与定位电池包的早期故障至关重要。该文提出一种基于改进局部引力分析的锂离子电池包早期故障检测与定位方法。首先,基于电池单体的局部引力特征提出温度异常指数(temperature abnormality index,TAI),定量评估电池系统的温度场不一致性。随后,采用非参数核密度估计(kernel density estimation,KDE)自适应计算温度异常指数的阈值,实现故障的快速检测,并通过设计局部引力贡献度函数来实现故障单体的精确定位。在6s4p锂离子电池包上设计了9组参数不同的内短路故障,对所提出的方法进行实验验证。结果表明,该方法能够快速检测和精确定位早期内短路故障,误报率不超过1.5%,检测延迟不超过90 s,故障定位准确率高达100%。
Abstract
During long-term operation
the complex chemical reactions and physical processes of Li-ion batteries (LIBs) may induce faults
thereby threatening system safety. Therefore
it is crucial to accurately and efficiently detect and locate early faults in battery packs. This paper proposes a method for early fault detection and localization of LIB packs based on improved local gravitation analysis. Firstly
based on the local gravity characteristics of the battery cell
this study proposes the temperature abnormality index (TAI) to quantitatively evaluate the temperature field inconsistency of the battery system. Subsequently
this paper adaptively caclulates the threshold of the TAI using non-parametric kernel density estimation (KDE) to achieve rapid fault detection
and designs the local gravitation contribution function to achieve accurate localization of the faulty cell. This paper designs 9 groups of internal short circuit faults with different parameters on a 6s4p lithium-ion battery pack to experimentally verify the proposed method. Experimental results show that this method can quickly detect and accurately locate early internal short circuit faults