High Common-mode Rejection Ratio Isolation Voltage Probe Design for Power Devices

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Power Electronics | 更新时间：2026-02-05

- High Common-mode Rejection Ratio Isolation Voltage Probe Design for Power Devices
- Proceedings of the CSEE Vol. 45, Issue 13, Pages: 5280-5293(2025)
- 作者机构：
  
  省部共建电工装备可靠性与智能化国家重点实验室(河北工业大学), 天津市北辰区 300401
- 作者简介：
- 基金信息：
  
  National Natural Science Foundation of China(52377179)
- DOI：10.13334/j.0258-8013.pcsee.241410
  CLC： TM395
- Received：17 June 2024，
  
  Online First：04 November 2024，
  
  Published：05 July 2025
- 稿件说明：
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Zhen XIN, Xinwei MA, Yaokang LAI, et al. High Common-mode Rejection Ratio Isolation Voltage Probe Design for Power Devices[J]. Proceedings of the CSEE, 2025, 45(13): 5280-5293.
DOI：

Zhen XIN, Xinwei MA, Yaokang LAI, et al. High Common-mode Rejection Ratio Isolation Voltage Probe Design for Power Devices[J]. Proceedings of the CSEE, 2025, 45(13): 5280-5293. DOI： 10.13334/j.0258-8013.pcsee.241410.

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