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A Parameter-distributed Degradation Model Based Method for IGBT Modules Lifetime Prediction
Power Electronics | 更新时间：2026-02-06

    • A Parameter-distributed Degradation Model Based Method for IGBT Modules Lifetime Prediction

    • “New progress has been made in the research of IGBT device life prediction. Experts have proposed a probability prediction method for life distribution based on distributed parameter degradation model, which effectively addresses the problem of device service life dispersion and provides new ideas for accurate prediction of device life.”
    • Proceedings of the CSEE   Vol. 45, Issue 10, Pages: 4007-4017(2025)

    • DOI：10.13334/j.0258-8013.pcsee.240642    

      CLC： TN322.8

    • Received：20 March 2024，

      Online First：02 August 2024，

      Published：20 May 2025

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  • Siyu CHEN, Hui LI, Wei LAI, et al. A Parameter-distributed Degradation Model Based Method for IGBT Modules Lifetime Prediction[J]. Proceedings of the CSEE, 2025, 45(10): 4007-4017. DOI： 10.13334/j.0258-8013.pcsee.240642.

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School of Electrical Engineering and Automation, Harbin Institute of Technology
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South China University of Technology
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