
电工材料电气绝缘全国重点实验室(西安交通大学), 陕西省 西安市 710049
Received:30 January 2024,
Published Online:08 May 2024,
Published:20 June 2025
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Zhou GE, Kangning WU, Ge ZHAO, et al. Repair of High Voltage Cable Buffer Layer Defects and Reliability Study of One-component Silicone Rubber-based Repair Agent[J]. Proceedings of the CSEE, 2025, 45(12): 4917-4926.
Zhou GE, Kangning WU, Ge ZHAO, et al. Repair of High Voltage Cable Buffer Layer Defects and Reliability Study of One-component Silicone Rubber-based Repair Agent[J]. Proceedings of the CSEE, 2025, 45(12): 4917-4926. DOI: 10.13334/j.0258-8013.pcsee.240249.
近年来,高压电缆缓冲层烧蚀缺陷频繁出现,严重威胁了电缆的安全运行,因此亟需烧蚀缺陷的修复技术。为修复烧蚀缺陷,制备了一种单组份半导电硅橡胶基修复剂。通过真型电缆模拟烧蚀实验,结合有限元仿真,研究修复剂的修复效果与机理。通过电化学与元素分布测试,分析了修复剂对铝护套的腐蚀性及其与屏蔽层的相容性。结果表明,修复后缓冲层体积电阻率满足行业标准的要求。注入修复剂的缓冲层在模拟烧蚀后未出现烧蚀痕迹,且导电性能保持稳定。修复剂有效改善了缓冲层中的电流集中与电场畸变。缓冲层最大电流密度由烧蚀后的40.40 A/m
2
降至0.05 A/m
2
,气隙最高场强由7.91×10
4
kV/m降至1.39×10
-2
kV/m,有效地消除了缓冲层烧蚀隐患。此外,铝在未固化修复剂中的腐蚀速率仅为5.4×10
-3
mm/a,固化修复剂包覆处理的屏蔽层表面Si元素含量仅为1.0%。因此修复剂的注入不会引发铝护套电化学腐蚀和屏蔽层的溶胀,表明该修复剂在高压电缆中具有高可靠性。研究结果对实际电缆缓冲层烧蚀缺陷修复具有一定的指导意义。
High-voltage cable buffer layer ablation faults have occurred frequently in recent years
seriously threatening the safe operation of high-voltage cables
and thus the ablation faults repair technology is urgently needed. In order to repair the ablation faults
a one-component silicone-rubber-based repair agent is prepared in this paper. The effectiveness and mechanism of the repair agent are explored by both the ablation experiment on real cable and the electric field simulation. The effect of the repair agent on the aluminum sheath and shielding layer is analyzed by electrochemical measurements and element distribution tests. The repaired buffer layer achieves compliant volume resistivity and shows no ablation traces upon retesting. The electrical conductivity also remains stable during the ablation test. In addition
the repair agent effectively reduces the current concentration and the electric field distortion in the buffer layer. The maximum current density in the buffer layer is reduced from 40.40 A/m
2
to 0.05 A/m
2
and the maximum field strength in the air gap i
s reduced from 7.91×10
4
kV/m to 1.39×10
-2
kV/m. Therefore
the buffer layer ablation fault is effectively eliminated. Moreover
the corrosion rate of aluminum even in the uncured repair agent is only 5.4×10
-3
mm/a
and the Si element content in the surface of shielding treated with cured repair agent is only 1.0%. Therefore
the repair agent would not promote the electrochemical corrosion of the aluminumsheath and swelling of the shielding layer
showing a the high reliability of repair agent in the cable. The results of this paper could promote the repair of ablated buffer layers in high- voltage cables.
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