Investigation of the Simplified Equivalent Circuit Model of the Post-Arc Sheath Stage in DC Vacuum Circuit Breakers
|更新时间:2026-10-08
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Investigation of the Simplified Equivalent Circuit Model of the Post-Arc Sheath Stage in DC Vacuum Circuit Breakers
High VoltageVol. 11, Issue 4, (2026)
作者机构:
1. School of Electrical Engineering, Dalian University of Technology,Dalian,China
2. School of Electrical Engineering, Dalian Jiaotong University,Dalian,China
3. China Electric Power Research Institute,Beijing,China
4. State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology,Tianjin,China
Xubin Li, Xingyu Guo, Wen Wang, et al. Investigation of the Simplified Equivalent Circuit Model of the Post-Arc Sheath Stage in DC Vacuum Circuit Breakers[J]. High Voltage, 2026, 11(4).
DOI:
Xubin Li, Xingyu Guo, Wen Wang, et al. Investigation of the Simplified Equivalent Circuit Model of the Post-Arc Sheath Stage in DC Vacuum Circuit Breakers[J]. High Voltage, 2026, 11(4).DOI: 10.1049/hve2.70144.
Investigation of the Simplified Equivalent Circuit Model of the Post-Arc Sheath Stage in DC Vacuum Circuit Breakers
摘要
Abstract
This paper presents a simplified equivalent circuit model (ECM) for the post-arc sheath stage in DC vacuum circuit breakers and outlines the method for calculating circuit parameters using the particle-in-cell Monte Carlo collision (PIC-MCC) method. The post-arc sheath is modelled as a parallel combination of a variable resistor and a variable capacitor. Based on a specific DC experimental case
the PIC-MCC simulation provides essential parameters of charged particles and electric field data for calculating equivalent resistance and capacitance. The total current through the circuit components is calculated by applying the transient recovery voltage (TRV)
and the resulting post-arc current (PAC) waveform is compared with experimental results to validate the simplified ECM and the proposed parameter calculation approach. Further simulations study the impact of the initial drift velocity of charged particles on equivalent circuit parameters and PAC traces
showing that higher drift velocities increase capacitance and decrease resistance
leading to higher PAC peaks. The comparison with experimental data indicates that considering the drift velocity contributes to the simulation accuracy.
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