Liangtian Zhang, Yuyan Chen, Zhaochen Wang, et al. Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors[J]. Electrical Materials and Applications, 2026, 3(1).
DOI:
Liangtian Zhang, Yuyan Chen, Zhaochen Wang, et al. Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors[J]. Electrical Materials and Applications, 2026, 3(1).DOI: 10.1049/ema3.70031.
Long-Term Thermal Stability of Electron-Beam-Irradiation-Crosslinked Polypropylene Films for Power Capacitors
摘要
The operating temperature of metallised polypropylene film capacitors (MPPFCs) has been steadily increasing. The polypropylene (PP) dielectric film undergoes severe degradation at high temperature constraining system reliability. In this study
accelerated thermal ageing experiments were performed to assess the long-term thermal stability of electron-beam-crosslinked polypropylene (EIPP) films. The effects of ageing at 125°C for up to 600 h on the chemical structure and dielectric properties of pristine PP and EIPP were systematically investigated. For pristine PP
intensified oxidative degradation at high temperature induces molecular chain scission leading to decreased crystallinity and degraded dielectric performance. In contrast
EIPP forms a compact spherulitic morphology and a stable crosslinked network effectively restraining chain mobility and oxygen diffusion. After 600 h of ageing
EIPP exhibits a 53.8% longer oxidation induction time
an electrical conductivity that is only 28.1% of that of pristine PP and a 56.5% enhancement in maximum energy storage density compared with pristine PP. These results demonstrate that electron-beam-induced crosslinking significantly improves the long-term thermal stability of PP films
providing a promising pathway for high-temperature capacitors used in high-voltage direct current systems and DC–DC converters.
Abstract
The operating temperature of metallised polypropylene film capacitors (MPPFCs) has been steadily increasing. The polypropylene (PP) dielectric film undergoes severe degradation at high temperature constraining system reliability. In this study
accelerated thermal ageing experiments were performed to assess the long-term thermal stability of electron-beam-crosslinked polypropylene (EIPP) films. The effects of ageing at 125°C for up to 600 h on the chemical structure and dielectric properties of pristine PP and EIPP were systematically investigated. For pristine PP
intensified oxidative degradation at high temperature induces molecular chain scission leading to decreased crystallinity and degraded dielectric performance. In contrast
EIPP forms a compact spherulitic morphology and a stable crosslinked network effectively restraining chain mobility and oxygen diffusion. After 600 h of ageing
EIPP exhibits a 53.8% longer oxidation induction time
an electrical conductivity that is only 28.1% of that of pristine PP and a 56.5% enhancement in maximum energy storage density compared with pristine PP. These results demonstrate that electron-beam-induced crosslinking significantly improves the long-term thermal stability of PP films
providing a promising pathway for high-temperature capacitors used in high-voltage direct current systems and DC–DC converters.
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