LIU Weiguo, XIE Guosheng, Qiu Yingjun, et al. Study on Resistance Current Limiting Device′s Ability of Withstanding Short Circuit Current[J]. 2019, 39(1): 1-4+25.
LIU Weiguo, XIE Guosheng, Qiu Yingjun, et al. Study on Resistance Current Limiting Device′s Ability of Withstanding Short Circuit Current[J]. 2019, 39(1): 1-4+25.DOI:
Study on Resistance Current Limiting Device′s Ability of Withstanding Short Circuit Current
摘要
本文通过理论计算和试验测试
从短时发热和电动力两个方面提出了一种S型短距多层结构电阻器
该电阻器可极大提升电阻限流装置抗短路电流能力
最后通过试验验证了该新型结构的电阻限流装置抗短路能力可达到标准要求。
Abstract
Through theoretical calculation and test
this paper proposes an S-type short distance multi-layer structure resistor which can greatly improve the resistance to short-circuit current of the resistor current limiting device. Finally
the experimental results show that the resistance to short circuit of the new structure can meet the standard requirements.