PbZrO(3)(PZ) thin films grown on fused quartz substrates are prepared by sol-gel process. The crystal structure of PZ thin films has been studied by XRD. The results show that the well-crystallized PZ thin film is pseudocubic phase. When the film on fused quartz substrate is annealed at 750?℃
the grain size is about 30~50?nm. The optical transmittance spectra of the PbZrO(3)thin films on fused quartz substrates annealed at 450
600 and 750?℃ are measured with a double-beam UV-VIS scanning spectrophotometer. The transmission spectra of the samples are measured
using air as a reference at a wavelength range 200 to 900?nm. The results show that the band gaps are 4.11