Aging Process and Breakdown Characteristic of Polyimide/Al2O3 Composite Film Under Corona Discharge
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Aging Process and Breakdown Characteristic of Polyimide/Al2O3 Composite Film Under Corona Discharge
Vol. 42, Issue 12, Pages: 3941-3947(2016)
作者机构:
1. 哈尔滨理工大学材料科学与工程学院
2. 哈尔滨理工大学工程电介质及其应用教育部重点实验室
作者简介:
基金信息:
DOI:
CLC:
Published Online:31 December 2016,
Published:2016
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ZHANG Mingyu, LIU Lizhu, WENG Ling, et al. Aging Process and Breakdown Characteristic of Polyimide/Al2O3 Composite Film Under Corona Discharge[J]. 2016, 42(12): 3941-3947.
DOI:
ZHANG Mingyu, LIU Lizhu, WENG Ling, et al. Aging Process and Breakdown Characteristic of Polyimide/Al2O3 Composite Film Under Corona Discharge[J]. 2016, 42(12): 3941-3947.DOI:
Aging Process and Breakdown Characteristic of Polyimide/Al2O3 Composite Film Under Corona Discharge
摘要
为探讨电晕放电对复合薄膜绝缘的损伤过程
参照GB/T 22689—2008标准
利用扫描电镜(SEM)、能谱仪(EDS)、红外光谱仪(FTIR)研究了PI/Al
2
O
3
薄膜在电晕放电下老化至击穿的整个过程。实验结果表明:随着电晕放电时间的延长
电晕破坏区的表面被破坏的越来越严重
表面的有机物逐渐减少
氧化铝越来越多
膨松的氧化铝在表面形成了连续覆盖层。电晕老化击穿后形成的击穿孔为20μm左右的圆形孔洞
定位击穿孔的位置发现击穿孔并不在电晕放电破坏的区域内
而在中心处不易散热的区域
这说明电晕老化击穿并不是传统的电击穿和电化学击穿引起的
而是由于电晕放电产生的热量积累引起材料发生了热击穿。
Abstract
In order to explore the damage mechanism of PI/Al
2
O
3
film caused by corona discharge(CD)
scanning electron microscopy(SEM)
energy dispersive spectroscopy(EDS)
and infrared spectrometer(FTIR) were used to study the PI/Al
2
O
3
film in entire corona aging process based on the standard GB/T 22689—2008. The results show that the surface of the corona damaged zone was destroyed seriously with the time of CD increasing
and the content of organic matter was decreasing gradually with more and more Al
2
O
3
appeared and formed a continuous Al
2
O
3
layer on the surface. Circular hole of about 20 μm was formed after breakdown of the corona aging. By locating the breakdown point
we found that the position of breakdown point was in the central
zone which hardly dissipate heat insteading of in the corona damaged zone. These results indicate that the corona aging breakdown of composite film is not a traditional electric breakdown or electrochemical breakdown but a thermal breakdown due to a lot of heat generated during CD process.