Arc phenomenon is a basic problem in the field of electrical engineering
and research in this field includes arc using and arc surppressing. It is hard to observe the physical properties of arc plasma by conventional experimental conditions
thus adoptions of modeling
calculating
experimenting and other analytical methods are regarded to be an important basis for optimizing the electrical structure and improving the technological process. On the basis of integrated arc research literatures
we reviewed the modeling mechanism and classification
the numerical calculation method
computational simulation software
application fields and testing system for arc conducted a comprehensive induction. First
arc models can be divided into external electrical characterization and internal physical-chemical characterization two modes
the former mainly focuses on the characteristics of arc external changes which regard the arc as a part of system circuit
model parameters could be defined through numerical fitting or empirical values extracted;The latter takes fluid mechanics
dynamics
thermodynamics
electromagnetism theory as modeling bases
which reflect the arc thermal plasma dynamic physical-chemical process of internal overall macroscopic fluid properties and particles microscopic properties
and belongs to the internal mechanism of arc formation analysis. Second
in numerical calculations
the conventional numerical computation and experiments are introduced in the field of content
difference and applicable scope
and subtotaling the numerical methods. According to the difference between the application object of arc model and application field
we introduce the calculation process and steps of several typical models. Third
we summarize the current commercial simulation software
introduces the algorithm
characteristics and operation steps
and summarize the applicable scope and field. Finally
according to the application field of arc and the background parameters of arc
we analyze the applicable theory basis and model type
review the using of test method and platform in different application occasions