“One-Zero” Phenomenon of Discharge Induced by Defects in SF6 Insulation Systems in GIS
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“One-Zero” Phenomenon of Discharge Induced by Defects in SF6 Insulation Systems in GIS
Vol. 45, Issue 9, Pages: 2689-2698(2019)
作者机构:
西安交通大学电力设备电气绝缘国家重点实验室
作者简介:
基金信息:
DOI:
CLC:
Published Online:30 September 2019,
Published:2019
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ZHANG Qiaogen, LI Xiao’ang, LIU Lin, et al. “One-Zero” Phenomenon of Discharge Induced by Defects in SF6 Insulation Systems in GIS[J]. 2019, 45(9): 2689-2698.
DOI:
ZHANG Qiaogen, LI Xiao’ang, LIU Lin, et al. “One-Zero” Phenomenon of Discharge Induced by Defects in SF6 Insulation Systems in GIS[J]. 2019, 45(9): 2689-2698.DOI:
“One-Zero” Phenomenon of Discharge Induced by Defects in SF6 Insulation Systems in GIS