Application of Extended Derivative Method in Analyzing Dielectric Responses of Dielectrics
|更新时间:2025-12-08
|
Application of Extended Derivative Method in Analyzing Dielectric Responses of Dielectrics
Vol. 46, Issue 2, Pages: 640-647(2020)
作者机构:
1. 西安交通大学电力设备电气绝缘国家重点实验室
2. 中国电力工程顾问集团西北电力设计院有限公司
作者简介:
基金信息:
DOI:
CLC:
Published Online:29 February 2020,
Published:2020
稿件说明:
移动端阅览
WU Kangning, HUANG Yuwei, WANG Ziyue, et al. Application of Extended Derivative Method in Analyzing Dielectric Responses of Dielectrics[J]. 2020, 46(2): 640-647.
DOI:
WU Kangning, HUANG Yuwei, WANG Ziyue, et al. Application of Extended Derivative Method in Analyzing Dielectric Responses of Dielectrics[J]. 2020, 46(2): 640-647.DOI:
Application of Extended Derivative Method in Analyzing Dielectric Responses of Dielectrics
Varied high-temperature and low-frequency dielectric characteristics are commonly detected in deteriorated engineering dielectrics
including increased dielectric permittivity
loss factor
etc. Consequently
a clear insight into those dielectric responses is of great significance to further degradation investigation and condition assessment. However
the relaxations are usually coupled with DC conductance so that they are easily covered by conductance component in low-frequency range
thus further studies on them are hardly to be carried out. What is worse
DC conductance is sometimes mistaken for a relaxation process in some dielectric spectra due to similar temperature and frequency dependence. Therefore
we proposed an extended derivative spectroscopy which only remains relaxations but excludes DC conductance. Taking three typical engineering dielectrics
such as poxy
oil-impregnated paper
and ZnO ceramics
as examples
we successfully characterized new low-frequency relaxations from the covered DC conductance via the improved spectra. Moreover
we discussed the physical mechanism of the relaxations in the three different dielectrics respectively. The results provide a potential approach for further manipulating and assessing properties of engineering dielectrics.