The comprehensive reliability analysis and evaluation method are vital to the optimal design of large capacity power electronic equipment

but its core problem has not been solved. Through the analysis of the physical failure mechanism of a device

different failure modes of various key devices can be obtained. In accordance with the theoretical basis of reliability research under the coupling of multi-physical fields

the reliability evaluation can be carried out more accurately for specific devices

systems

and physical fields under different time scales. We introduced the reliability research status of power semiconductor devices

capacitors and equipment

and analyzed the physical mechanism of device failure and reliability analysis methods. Summarizing the existing research problems

we proposed the corresponding solutions

and pointed out the future research direction of the reliability of large capacity power electronic equipment.