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Reliability Prediction of 220 kV Circuit Breakers Based on Moffat Rest Hidden Markov Degradation Process
更新时间:2025-12-08
    • Reliability Prediction of 220 kV Circuit Breakers Based on Moffat Rest Hidden Markov Degradation Process

    • Vol. 47, Issue 6, Pages: 2108-2116(2021)
    • Published Online:30 June 2021,

      Published:2021

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  • CUI Haoyang, XIA Sheng, ZHOU Kun, et al. Reliability Prediction of 220 kV Circuit Breakers Based on Moffat Rest Hidden Markov Degradation Process[J]. 2021, 47(6): 2108-2116. DOI:

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