Effect of Charge Traps on Electrical Aging of XLPE Insulation

ZHANG Jie; ZHAO Xuetong; BIAN Haoran; HOU Shuai; ZHANG Yifan; YANG Lijun

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Effect of Charge Traps on Electrical Aging of XLPE Insulation

更新时间：2025-12-08

- Effect of Charge Traps on Electrical Aging of XLPE Insulation
- Vol. 47, Issue 8, Pages: 2991-3000(2021)
- 作者机构：
  
  1. 重庆大学输配电装备及系统安全与新技术国家重点实验室
  2. 南方电网科学研究院有限责任公司
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published Online：31 August 2021，
  
  Published：2021
- 稿件说明：
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ZHANG Jie, ZHAO Xuetong, BIAN Haoran, et al. Effect of Charge Traps on Electrical Aging of XLPE Insulation[J]. 2021, 47(8): 2991-3000.
DOI：

ZHANG Jie, ZHAO Xuetong, BIAN Haoran, et al. Effect of Charge Traps on Electrical Aging of XLPE Insulation[J]. 2021, 47(8): 2991-3000. DOI：

摘要

交联聚乙烯(cross-linked polyethylene

XLPE)由于良好的电气性能而常被用作高压直流电缆的绝缘材料

但其内部缺陷形成的电荷陷阱会导致空间电荷积聚

从而加速绝缘材料的电老化。文中基于电荷陷阱对XLPE电缆绝缘电老化的影响

研究了电荷陷阱在XLPE电缆绝缘电老化过程的作用机理

并运用自由能增量理论定量地分析了电荷陷阱对电老化的影响。将电缆样品进行热老化预处理

得到具有不同电荷陷阱参数的XLPE样品

对其进行空间电荷测试和步进应力实验

验证了空间电荷陷阱和电老化进程之间的关系。结果表明

在XLPE电老化过程中

浅陷阱密度与材料的电老化速率正相关

而深陷阱对电老化过程起抑制作用。

Abstract

Cross-linked polyethylene（XLPE） is usually used as an insulating material for HVDC cables due to its excellent electrical properties

but the charge traps formed by its internal defects will lead to the accumulation of space charge

thus accelerating the electrical aging of the insulating material. Based on the effect of charge traps on the electrical aging of XLPE cable insulation

the mechanism of charge traps in the electrical aging process of XLPE cable insulation was investigated

and the effect of charge traps on the electrical aging was quantitatively analyzed by the theory of free energy increment. XLPE films with different charge trap parameters were fabricated by thermal pretreatment. Then

space charge tests and stepping stress tests were carried out to verify the correlation between space charge traps and electric aging process. The results show that

in the electric aging process of XLPE

the density of shallow traps is positively correlated with the aging rate in the electric aging process of materials

while deep traps inhibit the electrical aging process.

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Related Institution

School of Electrical Engineering and Information, Sichuan University

State Key Laboratory of Electricial Insulation and Power Equipment, Xi’an Jiaotong University

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特高压工程技术(昆明广州)国家工程实验室

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